
Maaike Godschalk
Specialist Infrared Temperature
Microscope optics for PI640 and XI400
The newly developed Microscope lenses are especially designed for thermal inspection of electronic boards and analyses of small chip level components down to 28 μm. The distance between the measurement object and the camera can vary between 80 and 100 mm
Technical specifications
Thermal imaging camera: PI640 and XI400
PI640: 28 μm, 12° x 9° (F=1.1) / f= 44 mm
XI400: 90 μm, 18° x 14° (f = 20 mm)
Infrared temperature meter
Infrared temperature meter
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